Super-Resolution Imaging
  | | | | | |
  DeltaVision|OMX SRTM

 

3D-SIMTM Super-Resolution Imaging

 

- Introducing the DeltaVision|OMX SR

New to the DeltaVision|OMX family, the DeltaVision|OMX SR is designed for customers who are seeking the super resolution capabilities of our 3D-SIM technology but do not require the optional conventional light imaging configuration and companion microscope found on our flagship DeltaVision|OMX platform.

Our new DeltaVision|OMX SR is designed for customers who are seeking the super resolution capabilities of our 3D-SIM technology but in a more economical configuration. The DeltaVision|OMX SR has the same structured illumination and super resolution capabilities as our DeltaVision|OMX system and is fully upgradable. This makes the DeltaVision|OMX SR an ideal solution for customers who already have a widefield imaging or confocal system but wish to step up to super resolution imaging.

  • Dedicated, cost effective, 3D-Structured Illumination Microscope.
  • Three Dimensional-Structured Illumination Microscopy (3D-SIM) Imaging
    - X,Y resolution between 80-120 nm
    - Z resolution between 250-350 nm (depending on wavelength)
    - >10 micron depth imaging (depending on spherical correction)
  • Fully upgradable to current DeltaVision|OMX capabilities.
  • Standard configuration: 60x, 1.42 NA, objective lens, 2 x Interline cameras, 405 nm and 488 nm lasers


(first image pair) dendrite - Images courtesy of Applied Precision. (second image pair) Glial cell - Image courtesy of Ed Ruthazer, McGill University

DeltaVision|OMX SR

   
 
Download a brochure
Adobe PDF document, 486KB

   







 
     
  DeltaVision® is a family of fully integrated, optimized microscopy systems designed to look at multiple probes and samples over longer periods of time than other imaging systems. These systems are uniquely suited for 3D and 2D live cell applications. As biological questions increase in complexity and sensitivity, there is a greater need for higher image quality. Improved resolution and contrast yield greater quantitative measurements and therefore more reliable results.
    © 2010 Applied Precision, Inc.